Ulrich Wahl, a researcher at C2TN, together with Lino Pereira and André Vantomme from Instituut voor Kern- en Stralingsfysica, KU Leuven, has co-authored chapter 11, entitled "Characterizing defects with ion beam analysis and channeling techniques", in the recently published book Characterisation and Control of Defects in Semiconductors, edited by F. Tuomisto (The Institution of Engineering and Technology, Stevenage, UK, 2019).